X-RAY-DIFFRACTION DETERMINATION OF INTERFACIAL ROUGHNESS CORRELATION IN SIXGE1-X/SI AND GAAS/ALXGA1-XAS SUPERLATTICES

TitleX-RAY-DIFFRACTION DETERMINATION OF INTERFACIAL ROUGHNESS CORRELATION IN SIXGE1-X/SI AND GAAS/ALXGA1-XAS SUPERLATTICES
Publication TypeJournal Article
Year of Publication1992
AuthorsPhang, YH, Savage, DE, Kuech, TF, Lagally, MG, Park, JS, Wang, KL
JournalApplied Physics Letters
Volume60
Pagination2986-2988
Date PublishedJun
DOI10.1063/1.106784