The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM

TitleThe probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM
Publication TypeJournal Article
Year of Publication2003
AuthorsFrazer, BH, Gilbert, B, Sonderegger, BR, Gilbert, PUPA
JournalSurface Science
Volume537
Pagination161-167
Date PublishedJul
ISBN Number0039-6028
Accession NumberWOS:000183850600019