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Book Chapter

Hamers RJ. Immobilization of biomolecules at semiconductor surfaces. In: Tao F, Bernasek S Functionalization of semiconductor surfaces. Functionalization of semiconductor surfaces. J. Wiley and Sons; 2011.

Hamers RJ, Wang X, Franking R, Ruther R, Stavis CS. Infrared spectroscopy for characterization of biomolecular interfaces. In: Pradier CM, Chabal Y Biointerface characterization by advanced IR spectroscopy. Biointerface characterization by advanced IR spectroscopy. Elsevier Press; 2011.

Hamers RJ. Integrating biological molecules with Group IV semiconductors for bioelectronic sensing. In: Katz E, Willner I Bioelectronics: Theory and application. Bioelectronics: Theory and application. VCH Publishers; 2004.

Banfield JF, Hamers RJ. Processes at minerals and surfaces with relevance to microorganisms and prebiotic synthesis. In: Banfield JF, Nealson KH Vol. 35. ; 1997. pp. 81-122.

Hamers RJ. Scanning tunneling microscopy. In: Chiarotti G Physics of Solid Surfaces. Physics of Solid Surfaces. Landolt-Bornstein; 1989.

Hamers RJ, Koch RH. Scanning tunneling microscopy and spectrosocpy of Si dangling bond defects. In: Helms CR Physical and chemistry of SiO₂ and the Si-SiO₂ Interface. Physical and chemistry of SiO₂ and the Si-SiO₂ Interface. Plenum Press; 1989.

Tromp RM, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. In: The Structure of Surfaces II. The Structure of Surfaces II. ; 1988.

Hamers RJ. Scanning tunneling microscopy on semiconductors. In: Wiesendanger R Scanning Tunneling Microscopy. Scanning Tunneling Microscopy. Springer-Verlag; 1992.

Conference Proceedings

Tromp R, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. Second international conference on the structure of surfaces. 1987.

Journal Article

Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. 1ST-ORDER TRANSITIONS BETWEEN SURFACE PHASES WITH DIFFERENT STEP STRUCTURES - REPLY. Physical Review Letters. 1991;66:962-962.

Bronikowski MJ, Wang YJ, McEllistrem MT, Chen D, Hamers RJ. ADSORPTION AND DISSOCIATION OF DISILANE ON SI(001) STUDIED BY STM. Surface Science. 1993;298:50-62.

Shan J, Wang YJ, Hamers RJ. Adsorption and dissociation of phosphine on Si(001). Journal of Physical Chemistry. 1996;100:4961-4969.

Schwartz MP, Barlow DE, Russell JN, Butler JE, D’Evelyn MP, Hamers RJ. Adsorption of acrylonitrile on diamond and silicon (001)-(2 x 1) surfaces: Effects of dimer structure on reaction pathways and product distributions. Journal of the American Chemical Society [Internet]. 2005;127:8348-8354. Available from: <Go to ISI>://000229751100042

Ellison MD, Hamers RJ. Adsorption of phenyl isothiocyanate on Si(001): A 1,2-dipolar surface addition reaction. Journal of Physical Chemistry B. 1999;103:6243-6251.

Chen XX, Frank ER, Hamers RJ. ADSORPTION OF SULFUR AND 1,3-BUTANEDIOL ON SILVER THIN-FILMS USING ATOMIC RESOLUTION-REDUCED-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1994;12:2091-2096.

Bronikowski MJ, Wang YJ, Hamers RJ. ANTIPHASE BOUNDARIES AS NUCLEATION CENTERS IN LOW-TEMPERATURE SILICON EPITAXIAL-GROWTH. Physical Review B. 1993;48:12361-12364.

Morin SA, La YH, Liu CC, Streifer JA, Hamers RJ, Nealey PF, Jin S. Assembly of Nanocrystal Arrays by Block-Copolymer-Directed Nucleation. Angewandte Chemie-International Edition. 2009;48:2135-2139.

Tromp RM, Hamers RJ, Demuth JE. ATOMIC AND ELECTRONIC CONTRIBUTIONS TO SI(111)-(7X7) SCANNING-TUNNELING-MICROSCOPY IMAGES. Physical Review B. 1986;34:1388-1391.

Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters. 1990;64:1051-1054.

Bronikowski MJ, Hamers RJ. ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE ADSORPTION AND DISSOCIATION OF METHYLCHLORIDE ON SI(001). Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1995;13:777-781.

Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE THERMAL-DECOMPOSITION OF DISILANE ON SI(001). Surface Science. 1994;311:64-100.

Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED STM STUDY OF THE INTERACTION OF PHOSPHINE WITH THE SILICON(001) SURFACE. Journal of Physical Chemistry. 1994;98:5966-5973.

Hamers RJ, Chen X, Frank ER, Higgins SR, Shan J, Wang Y. Atomically-resolved investigations of surface reaction chemistry by scanning tunneling microscopy. Israel Journal of Chemistry. 1996;36:11-24.

Hamers RJ, Wang YJ. Atomically-resolved studies of the chemistry and bonding at silicon surfaces. Chemical Reviews. 1996;96:1261-1290.

Hamers RJ, Wang YJ, Shan J. Atomic-level spatial distributions of dopants on silicon surfaces: Toward a microscopic understanding of surface chemical reactivity. Applied Surface Science. 1996;107:25-34.

Chen X, Frank ER, Hamers RJ. AN ATOMIC-RESOLUTION CRYOGENIC SCANNING TUNNELING MICROSCOPE. Review of Scientific Instruments. 1994;65:3373-3377.

Wang YJ, Chen XX, Hamers RJ. ATOMIC-RESOLUTION STUDY OF OVERLAYER FORMATION AND INTERFACIAL MIXING IN THE INTERACTION OF PHOSPHORUS WITH SI(001). Physical Review B. 1994;50:4534-4547.

Hamers RJ. ATOMIC-RESOLUTION SURFACE SPECTROSCOPY WITH THE SCANNING TUNNELING MICROSCOPE. Annual Review of Physical Chemistry. 1989;40:531-559.

Hamers RJ. ATOMIC-SCALE IMAGING WITH THE SCANNING TUNNELING MICROSCOPE. Mrs Bulletin. 1991;16:22-26.

Wang YJ, Hamers RJ, Kaxiras E. ATOMIC-STRUCTURE AND BONDING OF BORON-INDUCED RECONSTRUCTIONS ON SI(001). Physical Review Letters. 1995;74:403-406.

Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:512-516.

Gonzalez-Moreno R, Cook PL, Zegkinoglou I, Liu X, Johnson PS, Yang W, Ruther RE, Hamers RJ, Tena-Zaera R, Himpsel FJ, et al. Attachment of Protoporphyrin Dyes to Nanostructured ZnO Surfaces: Characterization by Near Edge X-ray Absorption Fine Structure Spectroscopy. Journal of Physical Chemistry C. 2011;115:18195-18201.

Banfield J, Girhring T, Hamers RJ. Bacterial method for conversion of arsenite to arsenate. 2001.

Hamers RJ. Bond breaking at surfaces: Electrons or phonons?. Surface Science [Internet]. 2005;583:1-3. Available from: <Go to ISI>://000229423500001

Cao XP, Coulter SK, Ellison MD, Liu HB, Liu JM, Hamers RJ. Bonding of nitrogen-containing organic molecules to the silicon(001) surface: The role of aromaticity. Journal of Physical Chemistry B [Internet]. 2001;105:3759-3768. Available from: <Go to ISI>://000168624400013

Wang YJ, Hamers RJ. BORON-INDUCED MORPHOLOGY CHANGES IN SILICON CHEMICAL-VAPOR-DEPOSITION - A SCANNING-TUNNELING-MICROSCOPY STUDY. Applied Physics Letters. 1995;66:2057-2059.

Wang YJ, Hamers RJ. BORON-INDUCED RECONSTRUCTIONS OF SI(001) INVESTIGATED BY SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1995;13:1431-1437.

Paoprasert P, Laaser JE, Xiong W, Franking RA, Hamers RJ, Zanni MT, Schmidt JR, Gopalan P. Bridge-Dependent Interfacial Electron Transfer from Rhenium-Bipyridine Complexes to TiO2 Nanocrystalline Thin Films. Journal of Physical Chemistry C. 2010;114:9898-9907.

Lockett MR, Weibel SC, Phillips MF, Shortreed MR, Sun B, Corn RM, Hamers RJ, Cerrina F, Smith LM. Carbon-on-metal films for surface plasmon resonance detection of DNA arrays. Journal of the American Chemical Society. 2008;130:8611-+.

Koch RH, Hamers RJ. CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY. Surface Science. 1987;181:333-339.

Hamers RJ. CHARACTERIZATION OF LOCALIZED ATOMIC SURFACE-DEFECTS BY TUNNELING MICROSCOPY AND SPECTROSCOPY. Journal of Vacuum Science & Technology B. 1988;6:1462-1467.

Hamers RJ, Stavis C, Pokhrel A, Franking R, Ruther RE, Wang X, Cooperrider MC, Zheng H, Carlisle JA, Butler JE. Characterization of molecular and biomolecular layers on diamond thin films by infrared reflection-absorption spectroscopy. Diamond and Related Materials. 2011;20:733-742.

Cahill DG, Hamers RJ. CHARGE DYNAMICS AT THE SILICON(001) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY AND SURFACE PHOTOVOLTAGE. Scanning Microscopy. 1992;6:931-936.

Higgins SR, Hamers RJ. Chemical dissolution of the galena(001) surface observed using electrochemical scanning tunneling microscopy. Geochimica et Cosmochimica Acta. 1996;60:3067-3073.

McGuire MM, Jallad KN, Ben-Amotz D, Hamers RJ. Chemical mapping of elemental sulfur on pyrite and arsenopyrite surfaces using near-infrared Raman imaging microscopy. Applied Surface Science [Internet]. 2001;178:105-115. Available from: <Go to ISI>://000169475300013

Cai W, Lin Z, Strother T, Smith LM, Hamers RJ. Chemical modification and patterning of iodine-terminated silicon surfaces using visible light. Journal of Physical Chemistry BJournal of Physical Chemistry B. 2002;106:2656-2664.

Cai W, Lin Z, Strother T, Smith LM, Hamers RJ. Chemical Modification and Patterning of Iodine-Terminated Silicon Surfaces Using Visible Light. The Journal of Physical Chemistry B [Internet]. 2002;106:2656-2664. Available from: http://pubs.acs.org/doi/abs/10.1021/jp013523h

Shah S, Benson MC, Bishop LM, Huhn AM, Ruther RE, Yeager JC, Tan YZ, Louis KM, Hamers RJ. Chemically assembled heterojunctions of SnO2 nanorods with TiO2 nanoparticles via "click" chemistry. Journal of Materials Chemistry. 2012;22:11561-11567.

Cardiel AC, Benson MC, Bishop LM, Louis KM, Yeager JC, Tan Y, Hamers RJ. Chemically Directed Assembly of Photoactive Metal Oxide Nanoparticle Heterojunctions via the Copper-Catalyzed Azide-Alkyne Cycloaddition "Click" Reaction. ACS Nano. 2012;6:310-318.

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