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Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. 1ST-ORDER TRANSITIONS BETWEEN SURFACE PHASES WITH DIFFERENT STEP STRUCTURES - REPLY. Physical Review Letters. 1991;66:962-962.

Tromp RM, Hamers RJ, Demuth JE. ATOMIC AND ELECTRONIC CONTRIBUTIONS TO SI(111)-(7X7) SCANNING-TUNNELING-MICROSCOPY IMAGES. Physical Review B. 1986;34:1388-1391.

Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:512-516.

Manassen Y, Hamers RJ, Demuth JE, Castellano AJ. DIRECT OBSERVATION OF THE PRECESSION OF INDIVIDUAL PARAMAGNETIC SPINS ON OXIDIZED SILICON SURFACES. Physical Review Letters. 1989;62:2531-2534.

Hamers RJ, Tromp RM, Demuth JE. ELECTRONIC AND GEOMETRIC STRUCTURE OF SI(111)-(7X7) AND SI(001) SURFACES. Surface Science. 1987;181:346-355.

Hamers RJ, Demuth JE. ELECTRONIC-STRUCTURE OF LOCALIZED SI DANGLING-BOND DEFECTS BY TUNNELING SPECTROSCOPY - REPLY. Physical Review Letters [Internet]. 1989;62:2424-2424. Available from: <Go to ISI>://A1989U545900025

Hamers RJ, Demuth JE. ELECTRONIC-STRUCTURE OF LOCALIZED SI DANGLING-BOND DEFECTS BY TUNNELING SPECTROSCOPY. Physical Review Letters. 1988;60:2527-2530.

Hamers RJ, Kohler UK, Demuth JE. EPITAXIAL-GROWTH OF SILICON ON SI(001) BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:195-200.

Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. FINITE-TEMPERATURE PHASE-DIAGRAM OF VICINAL SI(100) SURFACES. Physical Review Letters. 1990;64:2406-2409.

Demuth JE, Hamers RJ, Tromp RM. IMAGING OF SURFACE ATOMS AND THEIR WAVE-FUNCTIONS WITH THE SCANNING TUNNELING MICROSCOPE. Journal of Vacuum Science & Technology B. 1987;5:1528-1529.

Hashizume T, Hamers RJ, Demuth JE, Markert K, Sakurai T. INITIAL-STAGE DEPOSITION OF AG ON THE SI(100)2X1 SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:249-250.

Demuth JE, Vonlenen EJ, Tromp RM, Hamers RJ. LOCAL ELECTRONIC-STRUCTURE AND SURFACE GEOMETRY OF AG ON SI(111). Journal of Vacuum Science & Technology B. 1988;6:18-26.

Vanloenen EJ, Demuth JE, Tromp RM, Hamers RJ. LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG. Physical Review Letters. 1987;58:373-376.

Hamers RJ, Kohler UK, Demuth JE. NUCLEATION AND GROWTH OF EPITAXIAL SILICON ON SI(001) AND SI(111) SURFACES BY SCANNING TUNNELING MICROSCOPY. Ultramicroscopy. 1989;31:10-19.

Demuth JE, Koehler UK, Hamers RJ, Kaplan P. PHASE-SEPARATION ON AN ATOMIC SCALE - THE FORMATION OF A NOVEL QUASIPERIODIC 2D-STRUCTURE. Physical Review Letters. 1989;62:641-644.

Tromp RM, Hamers RJ, Demuth JE. QUANTUM STATES AND ATOMIC-STRUCTURE OF SILICON SURFACES. Science. 1986;234:304-309.

Demuth JE, Hamers RJ, Tromp RM, Welland ME. A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES. Ibm Journal of Research and Development. 1986;30:396-402.

Hamers RJ, Koch RH, Demuth JE. SCANNING TUNNELING MICROSCOPY - AN ATOMIC-SCALE PROBE OF SURFACE GEOMETRY AND ELECTRONIC-STRUCTURE. Journal of the Electrochemical Society. 1988;135:C136-C136.

Tromp R, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. Second international conference on the structure of surfaces. 1987.

Tromp RM, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. In: The Structure of Surfaces II. The Structure of Surfaces II. ; 1988.

Hamers RJ, Tromp RM, Demuth JE. SCANNING TUNNELING MICROSCOPY OF SI(001). Physical Review B. 1986;34:5343-5357.

Kohler U, Demuth JE, Hamers RJ. SCANNING TUNNELING MICROSCOPY STUDY OF LOW-TEMPERATURE EPITAXIAL-GROWTH OF SILICON ON SI(111)-(7X7). Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1989;7:2860-2867.

Tromp RM, Hamers RJ, Demuth JE. SI(001) DIMER STRUCTURE OBSERVED WITH SCANNING TUNNELING MICROSCOPY. Physical Review Letters. 1985;55:1303-1306.

Demuth JE, Hamers RJ, Tromp RM, Welland ME. A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1986;4:1320-1323.

Demuth JE, Koehler U, Hamers RJ. THE STM LEARNING-CURVE AND WHERE IT MAY TAKE US. Journal of Microscopy-Oxford. 1988;152:299-316.

Demuth JE, Koehler U, Hamers RJ. SURFACE DIFFRACTOMETRY AND LATTICE IMAGING OF SCANNING TUNNELING MICROSCOPY IMAGES. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:214-217.

Hamers RJ, Tromp RM, Demuth JE. SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE. Physical Review Letters. 1986;56:1972-1975.

Kohler UK, Demuth JE, Hamers RJ. SURFACE RECONSTRUCTION AND THE NUCLEATION OF PALLADIUM SILICIDE ON SI(111). Physical Review Letters. 1988;60:2499-2502.

Frenken JWM, Hamers RJ, Demuth JE. THERMAL ROUGHENING STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:293-296.

Schneir J, Sonnenfeld R, Marti O, Hansma PK, Demuth JE, Hamers RJ. TUNNELING MICROSCOPY, LITHOGRAPHY, AND SURFACE-DIFFUSION ON AN EASILY PREPARED, ATOMICALLY FLAT GOLD SURFACE. Journal of Applied Physics. 1988;63:717-721.

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