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Hamers RJ, Wietfeldt JR, Wright JC. DEFECT CHEMISTRY IN CAF2-EU3+. Journal of Chemical Physics. 1982;77:683-692.

Hamers RJ, Houston PL, Merrill RP. DIRECT-INELASTIC AND TRAPPING-DESORPTION SCATTERING OF NO(V=0,J) FROM IR(111) - ANGULAR, VELOCITY, AND ROTATIONAL ENERGY-DISTRIBUTIONS. Journal of Chemical Physics. 1985;83:6045-6046.

Hamers RJ, Tromp RM, Demuth JE. SCANNING TUNNELING MICROSCOPY OF SI(001). Physical Review B. 1986;34:5343-5357.

Hamers RJ, Tromp RM, Demuth JE. SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE. Physical Review Letters. 1986;56:1972-1975.

Hamers RJ, Avouris P, Bozso F. IMAGING OF CHEMICAL-BOND FORMATION WITH THE SCANNING TUNNELING MICROSCOPE - NH3 DISSOCIATION ON SI(001). Physical Review Letters. 1987;59:2071-2074.

Hamers RJ, Tromp RM, Demuth JE. ELECTRONIC AND GEOMETRIC STRUCTURE OF SI(111)-(7X7) AND SI(001) SURFACES. Surface Science. 1987;181:346-355.

Hamers RJ. CHARACTERIZATION OF LOCALIZED ATOMIC SURFACE-DEFECTS BY TUNNELING MICROSCOPY AND SPECTROSCOPY. Journal of Vacuum Science & Technology B. 1988;6:1462-1467.

Hamers RJ, Avouris P, Bozso F. A SCANNING TUNNELING MICROSCOPY STUDY OF THE REACTION OF SI(001)-(2X1) WITH NH3. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:508-511.

Hamers RJ, Demuth JE. ELECTRONIC-STRUCTURE OF LOCALIZED SI DANGLING-BOND DEFECTS BY TUNNELING SPECTROSCOPY. Physical Review Letters. 1988;60:2527-2530.

Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:512-516.

Hamers RJ, Houston PL, Merrill RP. COMPETITION BETWEEN DIRECT-INELASTIC AND TRAPPING DESORPTION CHANNELS IN THE SCATTERING OF NO (V=O,J) FROM IR(111). Journal of Chemical Physics. 1988;88:6548-6555.

Hamers RJ, Koch RH, Demuth JE. SCANNING TUNNELING MICROSCOPY - AN ATOMIC-SCALE PROBE OF SURFACE GEOMETRY AND ELECTRONIC-STRUCTURE. Journal of the Electrochemical Society. 1988;135:C136-C136.

Hamers RJ. EFFECTS OF COVERAGE ON THE GEOMETRY AND ELECTRONIC-STRUCTURE OF AL OVERLAYERS ON SI(111). Physical Review B. 1989;40:1657-1671.

Hamers RJ. ATOMIC-RESOLUTION SURFACE SPECTROSCOPY WITH THE SCANNING TUNNELING MICROSCOPE. Annual Review of Physical Chemistry. 1989;40:531-559.

Hamers RJ, Kohler UK. DETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1989;7:2854-2859.

Hamers RJ, Kohler UK, Demuth JE. NUCLEATION AND GROWTH OF EPITAXIAL SILICON ON SI(001) AND SI(111) SURFACES BY SCANNING TUNNELING MICROSCOPY. Ultramicroscopy. 1989;31:10-19.

Hamers RJ, Cahill DG. ULTRAFAST TIME RESOLUTION IN SCANNED PROBE MICROSCOPIES. Applied Physics Letters. 1990;57:2031-2033.

Hamers RJ, Kohler UK, Demuth JE. EPITAXIAL-GROWTH OF SILICON ON SI(001) BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:195-200.

Hamers RJ, Markert K. SURFACE PHOTOVOLTAGE ON SI(111)-(7X7) PROBED BY OPTICALLY PUMPED SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:3524-3530.

Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters. 1990;64:1051-1054.

Hamers RJ. ATOMIC-SCALE IMAGING WITH THE SCANNING TUNNELING MICROSCOPE. Mrs Bulletin. 1991;16:22-26.

Hamers RJ, Cahill DG. ULTRAFAST TIME RESOLUTION IN SCANNED PROBE MICROSCOPES - SURFACE PHOTOVOLTAGE ON SI(111)-(7X7). Journal of Vacuum Science & Technology B. 1991;9:514-518.

Hamers RJ. Scanned probe microscopies in chemistry. Journal of Physical Chemistry. 1996;100:13103-13120.

Hamers RJ. Eighth international conference on scanning tunneling microscopy/spectroscopy and related techniques - Preface. Journal of Vacuum Science & Technology B. 1996;14:787-787.

Hamers RJ, Chen X, Frank ER, Higgins SR, Shan J, Wang Y. Atomically-resolved investigations of surface reaction chemistry by scanning tunneling microscopy. Israel Journal of Chemistry. 1996;36:11-24.

Hamers RJ, Wang YJ. Atomically-resolved studies of the chemistry and bonding at silicon surfaces. Chemical Reviews. 1996;96:1261-1290.

Hamers RJ, Wang YJ, Shan J. Atomic-level spatial distributions of dopants on silicon surfaces: Toward a microscopic understanding of surface chemical reactivity. Applied Surface Science. 1996;107:25-34.

Hamers RJ, Hovis JS, Lee S, Liu HB, Shan J. Formation of ordered, anisotropic organic monolayers on the Si(001) surface. Journal of Physical Chemistry B. 1997;101:1489-1492.

Hamers RJ, Hovis J, Liu H. Scanning tunneling microscopy of ordered organic monolayer films on Si(001). Acta Physica Polonica A. 1998;93:289-295.

Hamers RJ, Coulter SK, Ellison MD, Hovis JS, Padowitz DF, Schwartz MP, Greenlief CM, Russell JN. Cycloaddition chemistry of organic molecules with semiconductor surfaces. Accounts of Chemical Research. 2000;33:617-624.

Hamers RJ. Passivation and activation: How do monovalent atoms modify the reactivity of silicon surfaces? A perspective on the article, "The mechanism of amine formation on Si(100) activated with chlorine atoms", by C. C. Finstad, A.D. Thorsness, and A.J. Muscat. Surface Science. 2006;600:3361.

Hamers RJ, Baker S, Lee C-S. Methods for the production of sensor arrays using electrically addressable electrodes. 2006:13 pp.

Hamers RJ, Beck JD. Apparatus for transport and analysis of particles using dielectrophoresis. 2006:8pp.

Hamers RJ, Beck JD, Eriksson MA, Li B, Marcus MS, Shang L, Simmons J, Streifer JA. Electrically directed assembly and detection of nanowire bridges in aqueous media. Nanotechnology. 2006;17:S280.

Hamers RJ. Nanotechnology - Diamonds are for tethers. Nature. 2008;454:708-709.

Hamers RJ, Stavis C, Pokhrel A, Franking R, Ruther RE, Wang X, Cooperrider MC, Zheng H, Carlisle JA, Butler JE. Characterization of molecular and biomolecular layers on diamond thin films by infrared reflection-absorption spectroscopy. Diamond and Related Materials. 2011;20:733-742.

Hamers RJ, Wang X, Franking R, Ruther R, Stavis CS. Infrared spectroscopy for characterization of biomolecular interfaces. In: Pradier CM, Chabal Y Biointerface characterization by advanced IR spectroscopy. Biointerface characterization by advanced IR spectroscopy. Elsevier Press; 2011.

Hamers RJ. Immobilization of biomolecules at semiconductor surfaces. In: Tao F, Bernasek S Functionalization of semiconductor surfaces. Functionalization of semiconductor surfaces. J. Wiley and Sons; 2011.

Hamers RJ. Nanotechnology - Diamonds are for tethers. Nature [Internet]. 2008;454:708-709. Available from: <Go to ISI>://000258228000031

Hamers RJ. Formation and Characterization of Organic Monolayers on Semiconductor Surfaces. Annual Review of Analytical Chemistry [Internet]. 2008;1:707-736. Available from: <Go to ISI>://000262525200024

Hamers RJ. Bond breaking at surfaces: Electrons or phonons?. Surface Science [Internet]. 2005;583:1-3. Available from: <Go to ISI>://000229423500001

Hamers RJ, Butler JE, Lasseter T, Nichols BM, Russell JN, Tse KY, Yang WS. Molecular and biomolecular monolayers on diamond as an interface to biology. Diamond and Related Materials [Internet]. 2005;14:661-668. Available from: <Go to ISI>://000229751400081

Hamers RJ. Scanning tunneling microscopy Lerner RG, Triggs GL. 2005.

Hamers RJ. Integrating biological molecules with Group IV semiconductors for bioelectronic sensing. In: Katz E, Willner I Bioelectronics: Theory and application. Bioelectronics: Theory and application. VCH Publishers; 2004.

Hamers RJ, Cai W, Strother TC, Smith LM. MODIFIED CARBON, SILICON AND GERMANIUM SURFACES. 2002.

Hamers RJ. Flexible electronic futures. Nature [Internet]. 2001;412:489-490. Available from: <Go to ISI>://000170202900024

Hamers RJ, Hovis JS, Coulter SK, Ellison MD, Padowitz DF. Ultrathin organic layers on silicon surfaces. Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers [Internet]. 2000;39:4366-4371. Available from: <Go to ISI>://000088910000029

Hamers RJ, Hovis JS, Greenlief CM, Padowitz DF. Scanning tunneling microscopy of organic molecules and monolayers on silicon and germanium (001) surfaces. Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers [Internet]. 1999;38:3879-3887. Available from: <Go to ISI>://000081576700021

Hamers RJ. Scanning tunneling microscopy on semiconductors. In: Wiesendanger R Scanning Tunneling Microscopy. Scanning Tunneling Microscopy. Springer-Verlag; 1992.

Hamers RJ. Scanning Tunneling Microscopy. 1991.

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