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] . Scanning tunneling microscopy of semiconductor surfaces and interfaces. In: The Structure of Surfaces II. The Structure of Surfaces II. ; 1988.
. A SCANNING TUNNELING MICROSCOPY STUDY OF THE REACTION OF SI(001)-(2X1) WITH NH3. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:508-511.
. THE STM LEARNING-CURVE AND WHERE IT MAY TAKE US. Journal of Microscopy-Oxford. 1988;152:299-316.
. SURFACE RECONSTRUCTION AND THE NUCLEATION OF PALLADIUM SILICIDE ON SI(111). Physical Review Letters. 1988;60:2499-2502.
. TUNNELING MICROSCOPY, LITHOGRAPHY, AND SURFACE-DIFFUSION ON AN EASILY PREPARED, ATOMICALLY FLAT GOLD SURFACE. Journal of Applied Physics. 1988;63:717-721.
. CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY. Surface Science. 1987;181:333-339.
. ELECTRONIC AND GEOMETRIC STRUCTURE OF SI(111)-(7X7) AND SI(001) SURFACES. Surface Science. 1987;181:346-355.
. IMAGING OF CHEMICAL-BOND FORMATION WITH THE SCANNING TUNNELING MICROSCOPE - NH3 DISSOCIATION ON SI(001). Physical Review Letters. 1987;59:2071-2074.
. IMAGING OF SURFACE ATOMS AND THEIR WAVE-FUNCTIONS WITH THE SCANNING TUNNELING MICROSCOPE. Journal of Vacuum Science & Technology B. 1987;5:1528-1529.
. LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG. Physical Review Letters. 1987;58:373-376.
. THE REACTION OF SI(100) 2X1 WITH NO AND NH3 - THE ROLE OF SURFACE DANGLING BONDS. Journal of Vacuum Science & Technology B. 1987;5:1387-1392.
. Scanning tunneling microscopy of semiconductor surfaces and interfaces. Second international conference on the structure of surfaces. 1987.
. ATOMIC AND ELECTRONIC CONTRIBUTIONS TO SI(111)-(7X7) SCANNING-TUNNELING-MICROSCOPY IMAGES. Physical Review B. 1986;34:1388-1391.
. QUANTUM STATES AND ATOMIC-STRUCTURE OF SILICON SURFACES. Science. 1986;234:304-309.
. A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES. Ibm Journal of Research and Development. 1986;30:396-402.
. SCANNING TUNNELING MICROSCOPY OF SI(001). Physical Review B. 1986;34:5343-5357.
. A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1986;4:1320-1323.
. SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE. Physical Review Letters. 1986;56:1972-1975.
. DIRECT-INELASTIC AND TRAPPING-DESORPTION SCATTERING OF NO(V=0,J) FROM IR(111) - ANGULAR, VELOCITY, AND ROTATIONAL ENERGY-DISTRIBUTIONS. Journal of Chemical Physics. 1985;83:6045-6046.
. SI(001) DIMER STRUCTURE OBSERVED WITH SCANNING TUNNELING MICROSCOPY. Physical Review Letters. 1985;55:1303-1306.
. Defect chemistry in CaF2:Eu3+ . The Journal of Chemical Physics. 1982;77:683-692.
. DEFECT CHEMISTRY IN CAF2-EU3+. Journal of Chemical Physics. 1982;77:683-692.
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