All Faculty and Research Staff Publications

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1996
Shan J, Wang YJ, Hamers RJ. Adsorption and dissociation of phosphine on Si(001). Journal of Physical Chemistry. 1996 ;100:4961-4969.
Hamers RJ, Chen X, Frank ER, Higgins SR, Shan J, Wang Y. Atomically-resolved investigations of surface reaction chemistry by scanning tunneling microscopy. Israel Journal of Chemistry. 1996 ;36:11-24.
Hamers RJ, Wang YJ. Atomically-resolved studies of the chemistry and bonding at silicon surfaces. Chemical Reviews. 1996 ;96:1261-1290.
Hamers RJ, Wang YJ, Shan J. Atomic-level spatial distributions of dopants on silicon surfaces: Toward a microscopic understanding of surface chemical reactivity. Applied Surface Science. 1996 ;107:25-34.
Higgins SR, Hamers RJ. Chemical dissolution of the galena(001) surface observed using electrochemical scanning tunneling microscopy. Geochimica et Cosmochimica Acta. 1996 ;60:3067-3073.
Bronikowski MJ, Hamers RJ. The chemistry of gallium deposition on Si(001) from trimethylgallium: An atomically resolved STM study. Surface Science. 1996 ;348:311-324.
Wang YJ, Shan J, Hamers RJ. Combined scanning tunneling microscopy and infrared spectroscopy study of the interaction of diborane with Si(001). Journal of Vacuum Science & Technology B. 1996 ;14:1038-1042.
Hamers RJ. Eighth international conference on scanning tunneling microscopy/spectroscopy and related techniques - Preface. Journal of Vacuum Science & Technology B. 1996 ;14:787-787.
Higgins SR, Hamers RJ. Morphology and dissolution processes of metal sulfide minerals observed with the electrochemical scanning tunneling microscope. Journal of Vacuum Science & Technology B. 1996 ;14:1360-1364.
Hamers RJ. Scanned probe microscopies in chemistry. Journal of Physical Chemistry. 1996 ;100:13103-13120.
Chen X, Frank ER, Hamers RJ. Spatially and rotationally oriented adsorption of molecular adsorbates on Ag(111) investigated using cryogenic scanning tunneling microscopy. Journal of Vacuum Science & Technology B. 1996 ;14:1136-1140.
1990
Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters. 1990 ;64:1051-1054.
Hamers RJ, Kohler UK, Demuth JE. EPITAXIAL-GROWTH OF SILICON ON SI(001) BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:195-200.
Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. FINITE-TEMPERATURE PHASE-DIAGRAM OF VICINAL SI(100) SURFACES. Physical Review Letters. 1990 ;64:2406-2409.
Hashizume T, Hamers RJ, Demuth JE, Markert K, Sakurai T. INITIAL-STAGE DEPOSITION OF AG ON THE SI(100)2X1 SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:249-250.
Demuth JE, Koehler U, Hamers RJ. Surface Diffractometry and Lattice Imaging of Scanning Tunneling Microscopy Images. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:214-217.
Hamers RJ, Markert K. SURFACE PHOTOVOLTAGE ON SI(111)-(7X7) PROBED BY OPTICALLY PUMPED SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:3524-3530.
Frenken JWM, Hamers RJ, Demuth JE. Thermal Roughening Studied by Scanning Tunneling Microscopy. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990 ;8:293-296.
Hamers RJ, Cahill DG. Ultrafast Time Resolution in Scanned Probe Microscopies. Applied Physics Letters. 1990 ;57:2031-2033.

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