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Shi Y, Shen B, Bu HM, Yuan XL, Gu SL, Han P, Zhang R, Zheng YD. Investigation of switching kinetics of interface traps in metal-oxide-semiconductor-field-effect-transistors with ultra-narrow channels. Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review PapersJapanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers. 2002 ;41:2363-2366.