All Department Publications

Show only items where

Author

Type

Term

Year

Keyword

Found 272 results

Author Title Type [ Year

]

Filters: Author is Hamers, R. J. [Clear All Filters]

1982

Hamers RJ, Wietfeldt JR, Wright JC. DEFECT CHEMISTRY IN CAF2-EU3+. Journal of Chemical Physics. 1982;77:683-692.

Hamers RJ, Wietfeldt JR, Wright JC. Defect chemistry in CaF2:Eu3+ . The Journal of Chemical Physics. 1982;77:683-692.

1985

Hamers RJ, Houston PL, Merrill RP. DIRECT-INELASTIC AND TRAPPING-DESORPTION SCATTERING OF NO(V=0,J) FROM IR(111) - ANGULAR, VELOCITY, AND ROTATIONAL ENERGY-DISTRIBUTIONS. Journal of Chemical Physics. 1985;83:6045-6046.

Tromp RM, Hamers RJ, Demuth JE. SI(001) DIMER STRUCTURE OBSERVED WITH SCANNING TUNNELING MICROSCOPY. Physical Review Letters. 1985;55:1303-1306.

1986

Tromp RM, Hamers RJ, Demuth JE. ATOMIC AND ELECTRONIC CONTRIBUTIONS TO SI(111)-(7X7) SCANNING-TUNNELING-MICROSCOPY IMAGES. Physical Review B. 1986;34:1388-1391.

Tromp RM, Hamers RJ, Demuth JE. QUANTUM STATES AND ATOMIC-STRUCTURE OF SILICON SURFACES. Science. 1986;234:304-309.

Demuth JE, Hamers RJ, Tromp RM, Welland ME. A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES. Ibm Journal of Research and Development. 1986;30:396-402.

Hamers RJ, Tromp RM, Demuth JE. SCANNING TUNNELING MICROSCOPY OF SI(001). Physical Review B. 1986;34:5343-5357.

Demuth JE, Hamers RJ, Tromp RM, Welland ME. A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1986;4:1320-1323.

Hamers RJ, Tromp RM, Demuth JE. SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE. Physical Review Letters. 1986;56:1972-1975.

1987

Koch RH, Hamers RJ. CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY. Surface Science. 1987;181:333-339.

Hamers RJ, Tromp RM, Demuth JE. ELECTRONIC AND GEOMETRIC STRUCTURE OF SI(111)-(7X7) AND SI(001) SURFACES. Surface Science. 1987;181:346-355.

Hamers RJ, Avouris P, Bozso F. IMAGING OF CHEMICAL-BOND FORMATION WITH THE SCANNING TUNNELING MICROSCOPE - NH3 DISSOCIATION ON SI(001). Physical Review Letters. 1987;59:2071-2074.

Demuth JE, Hamers RJ, Tromp RM. IMAGING OF SURFACE ATOMS AND THEIR WAVE-FUNCTIONS WITH THE SCANNING TUNNELING MICROSCOPE. Journal of Vacuum Science & Technology B. 1987;5:1528-1529.

Vanloenen EJ, Demuth JE, Tromp RM, Hamers RJ. LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG. Physical Review Letters. 1987;58:373-376.

Avouris P, Bozso F, Hamers RJ. THE REACTION OF SI(100) 2X1 WITH NO AND NH3 - THE ROLE OF SURFACE DANGLING BONDS. Journal of Vacuum Science & Technology B. 1987;5:1387-1392.

Tromp R, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. Second international conference on the structure of surfaces. 1987.

1988

Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:512-516.

Hamers RJ. CHARACTERIZATION OF LOCALIZED ATOMIC SURFACE-DEFECTS BY TUNNELING MICROSCOPY AND SPECTROSCOPY. Journal of Vacuum Science & Technology B. 1988;6:1462-1467.

Hamers RJ, Houston PL, Merrill RP. COMPETITION BETWEEN DIRECT-INELASTIC AND TRAPPING DESORPTION CHANNELS IN THE SCATTERING OF NO (V=O,J) FROM IR(111). Journal of Chemical Physics. 1988;88:6548-6555.

Hamers RJ, Demuth JE. ELECTRONIC-STRUCTURE OF LOCALIZED SI DANGLING-BOND DEFECTS BY TUNNELING SPECTROSCOPY. Physical Review Letters. 1988;60:2527-2530.

Demuth JE, Vonlenen EJ, Tromp RM, Hamers RJ. LOCAL ELECTRONIC-STRUCTURE AND SURFACE GEOMETRY OF AG ON SI(111). Journal of Vacuum Science & Technology B. 1988;6:18-26.

Hamers RJ, Koch RH, Demuth JE. SCANNING TUNNELING MICROSCOPY - AN ATOMIC-SCALE PROBE OF SURFACE GEOMETRY AND ELECTRONIC-STRUCTURE. Journal of the Electrochemical Society. 1988;135:C136-C136.

Tromp RM, Vanloenen EJ, Hamers RJ, Demuth JE. Scanning tunneling microscopy of semiconductor surfaces and interfaces. In: The Structure of Surfaces II. The Structure of Surfaces II. ; 1988.

Hamers RJ, Avouris P, Bozso F. A SCANNING TUNNELING MICROSCOPY STUDY OF THE REACTION OF SI(001)-(2X1) WITH NH3. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:508-511.

Demuth JE, Koehler U, Hamers RJ. THE STM LEARNING-CURVE AND WHERE IT MAY TAKE US. Journal of Microscopy-Oxford. 1988;152:299-316.

Kohler UK, Demuth JE, Hamers RJ. SURFACE RECONSTRUCTION AND THE NUCLEATION OF PALLADIUM SILICIDE ON SI(111). Physical Review Letters. 1988;60:2499-2502.

Schneir J, Sonnenfeld R, Marti O, Hansma PK, Demuth JE, Hamers RJ. TUNNELING MICROSCOPY, LITHOGRAPHY, AND SURFACE-DIFFUSION ON AN EASILY PREPARED, ATOMICALLY FLAT GOLD SURFACE. Journal of Applied Physics. 1988;63:717-721.

1989

Hamers RJ. ATOMIC-RESOLUTION SURFACE SPECTROSCOPY WITH THE SCANNING TUNNELING MICROSCOPE. Annual Review of Physical Chemistry. 1989;40:531-559.

Hamers RJ, Kohler UK. DETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1989;7:2854-2859.

Tsao JY, Chason E, Koehler U, Hamers RJ. DIMER STRINGS, ANISOTROPIC GROWTH, AND PERSISTENT LAYER-BY-LAYER EPITAXY. Physical Review B [Internet]. 1989;40:11951-11954. Available from: <Go to ISI>://A1989CE11400065

Manassen Y, Hamers RJ, Demuth JE, Castellano AJ. DIRECT OBSERVATION OF THE PRECESSION OF INDIVIDUAL PARAMAGNETIC SPINS ON OXIDIZED SILICON SURFACES. Physical Review Letters. 1989;62:2531-2534.

Hamers RJ. EFFECTS OF COVERAGE ON THE GEOMETRY AND ELECTRONIC-STRUCTURE OF AL OVERLAYERS ON SI(111). Physical Review B. 1989;40:1657-1671.

Hamers RJ, Demuth JE. ELECTRONIC-STRUCTURE OF LOCALIZED SI DANGLING-BOND DEFECTS BY TUNNELING SPECTROSCOPY - REPLY. Physical Review Letters [Internet]. 1989;62:2424-2424. Available from: <Go to ISI>://A1989U545900025

Hamers RJ, Kohler UK, Demuth JE. NUCLEATION AND GROWTH OF EPITAXIAL SILICON ON SI(001) AND SI(111) SURFACES BY SCANNING TUNNELING MICROSCOPY. Ultramicroscopy. 1989;31:10-19.

Demuth JE, Koehler UK, Hamers RJ, Kaplan P. PHASE-SEPARATION ON AN ATOMIC SCALE - THE FORMATION OF A NOVEL QUASIPERIODIC 2D-STRUCTURE. Physical Review Letters. 1989;62:641-644.

Hamers RJ. Scanning tunneling microscopy. In: Chiarotti G Physics of Solid Surfaces. Physics of Solid Surfaces. Landolt-Bornstein; 1989.

Hamers RJ, Koch RH. Scanning tunneling microscopy and spectrosocpy of Si dangling bond defects. In: Helms CR Physical and chemistry of SiO₂ and the Si-SiO₂ Interface. Physical and chemistry of SiO₂ and the Si-SiO₂ Interface. Plenum Press; 1989.

Kohler U, Demuth JE, Hamers RJ. SCANNING TUNNELING MICROSCOPY STUDY OF LOW-TEMPERATURE EPITAXIAL-GROWTH OF SILICON ON SI(111)-(7X7). Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1989;7:2860-2867.

Hamers RJ, Wynne J j>. Time-resolved Tunneling Microscope. IBM Technical Disclosure Bulletin. 1989;31:350.

1990

Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters. 1990;64:1051-1054.

Hamers RJ, Kohler UK, Demuth JE. EPITAXIAL-GROWTH OF SILICON ON SI(001) BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:195-200.

Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. FINITE-TEMPERATURE PHASE-DIAGRAM OF VICINAL SI(100) SURFACES. Physical Review Letters. 1990;64:2406-2409.

Hashizume T, Hamers RJ, Demuth JE, Markert K, Sakurai T. INITIAL-STAGE DEPOSITION OF AG ON THE SI(100)2X1 SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:249-250.

Demuth JE, Koehler U, Hamers RJ. SURFACE DIFFRACTOMETRY AND LATTICE IMAGING OF SCANNING TUNNELING MICROSCOPY IMAGES. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:214-217.

Hamers RJ, Markert K. SURFACE PHOTOVOLTAGE ON SI(111)-(7X7) PROBED BY OPTICALLY PUMPED SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:3524-3530.

Frenken JWM, Hamers RJ, Demuth JE. THERMAL ROUGHENING STUDIED BY SCANNING TUNNELING MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1990;8:293-296.

Hamers RJ, Cahill DG. ULTRAFAST TIME RESOLUTION IN SCANNED PROBE MICROSCOPIES. Applied Physics Letters. 1990;57:2031-2033.

1991

Alerhand OL, Berker AN, Joannopoulos JD, Vanderbilt D, Hamers RJ, Demuth JE. 1ST-ORDER TRANSITIONS BETWEEN SURFACE PHASES WITH DIFFERENT STEP STRUCTURES - REPLY. Physical Review Letters. 1991;66:962-962.

Hamers RJ. ATOMIC-SCALE IMAGING WITH THE SCANNING TUNNELING MICROSCOPE. Mrs Bulletin. 1991;16:22-26.

About	People	Research	Academics	Services	Outreach	Connect	Give
Employment Opportunities	Directory	Labs	Undergraduate	Career Services	CHOPs	Events	Building Project
Visitor Info	Faculty List	Centers and Initiatives	Graduate	Facilities	ICE	News
Connect with Us	All Groups	Undergraduate Research	Courses		J. Chemical Education	Newsletter
Building Info	Awards	Publications			Science is Fun	Badger Chemist
Safety Info					WISL	Alumni E-News
Website Info						Social Media Policy
Contact Info

Expand Menu

Pages

Contact Us

University

Connect

Careers

Search form