All Department Publications

Found 272 results
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Filters: Author is Hamers, R. J.  [Clear All Filters]
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A
Bronikowski MJ, Wang YJ, McEllistrem MT, Chen D, Hamers RJ. ADSORPTION AND DISSOCIATION OF DISILANE ON SI(001) STUDIED BY STM. Surface Science. 1993;298:50-62.
Shan J, Wang YJ, Hamers RJ. Adsorption and dissociation of phosphine on Si(001). Journal of Physical Chemistry. 1996;100:4961-4969.
Schwartz MP, Barlow DE, Russell JN, Butler JE, D’Evelyn MP, Hamers RJ. Adsorption of acrylonitrile on diamond and silicon (001)-(2 x 1) surfaces: Effects of dimer structure on reaction pathways and product distributions. Journal of the American Chemical Society [Internet]. 2005;127:8348-8354. Available from: <Go to ISI>://000229751100042
Ellison MD, Hamers RJ. Adsorption of phenyl isothiocyanate on Si(001): A 1,2-dipolar surface addition reaction. Journal of Physical Chemistry B. 1999;103:6243-6251.
Chen XX, Frank ER, Hamers RJ. ADSORPTION OF SULFUR AND 1,3-BUTANEDIOL ON SILVER THIN-FILMS USING ATOMIC RESOLUTION-REDUCED-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1994;12:2091-2096.
Bronikowski MJ, Wang YJ, Hamers RJ. ANTIPHASE BOUNDARIES AS NUCLEATION CENTERS IN LOW-TEMPERATURE SILICON EPITAXIAL-GROWTH. Physical Review B. 1993;48:12361-12364.
Hamers RJ, Beck JD. Apparatus for transport and analysis of particles using dielectrophoresis. 2006:8pp.
Morin SA, La YH, Liu CC, Streifer JA, Hamers RJ, Nealey PF, Jin S. Assembly of Nanocrystal Arrays by Block-Copolymer-Directed Nucleation. Angewandte Chemie-International Edition. 2009;48:2135-2139.
Tromp RM, Hamers RJ, Demuth JE. ATOMIC AND ELECTRONIC CONTRIBUTIONS TO SI(111)-(7X7) SCANNING-TUNNELING-MICROSCOPY IMAGES. Physical Review B. 1986;34:1388-1391.
Hamers RJ, Markert K. ATOMICALLY RESOLVED CARRIER RECOMBINATION AT SI(111)-(7X7) SURFACES. Physical Review Letters. 1990;64:1051-1054.
Bronikowski MJ, Hamers RJ. ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE ADSORPTION AND DISSOCIATION OF METHYLCHLORIDE ON SI(001). Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1995;13:777-781.
Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED SCANNING-TUNNELING-MICROSCOPY STUDY OF THE THERMAL-DECOMPOSITION OF DISILANE ON SI(001). Surface Science. 1994;311:64-100.
Wang YJ, Bronikowski MJ, Hamers RJ. AN ATOMICALLY RESOLVED STM STUDY OF THE INTERACTION OF PHOSPHINE WITH THE SILICON(001) SURFACE. Journal of Physical Chemistry. 1994;98:5966-5973.
Hamers RJ, Chen X, Frank ER, Higgins SR, Shan J, Wang Y. Atomically-resolved investigations of surface reaction chemistry by scanning tunneling microscopy. Israel Journal of Chemistry. 1996;36:11-24.
Hamers RJ, Wang YJ. Atomically-resolved studies of the chemistry and bonding at silicon surfaces. Chemical Reviews. 1996;96:1261-1290.
Hamers RJ, Wang YJ, Shan J. Atomic-level spatial distributions of dopants on silicon surfaces: Toward a microscopic understanding of surface chemical reactivity. Applied Surface Science. 1996;107:25-34.
Chen X, Frank ER, Hamers RJ. AN ATOMIC-RESOLUTION CRYOGENIC SCANNING TUNNELING MICROSCOPE. Review of Scientific Instruments. 1994;65:3373-3377.
Wang YJ, Chen XX, Hamers RJ. ATOMIC-RESOLUTION STUDY OF OVERLAYER FORMATION AND INTERFACIAL MIXING IN THE INTERACTION OF PHOSPHORUS WITH SI(001). Physical Review B. 1994;50:4534-4547.
Hamers RJ. ATOMIC-RESOLUTION SURFACE SPECTROSCOPY WITH THE SCANNING TUNNELING MICROSCOPE. Annual Review of Physical Chemistry. 1989;40:531-559.
Hamers RJ. ATOMIC-SCALE IMAGING WITH THE SCANNING TUNNELING MICROSCOPE. Mrs Bulletin. 1991;16:22-26.
Wang YJ, Hamers RJ, Kaxiras E. ATOMIC-STRUCTURE AND BONDING OF BORON-INDUCED RECONSTRUCTIONS ON SI(001). Physical Review Letters. 1995;74:403-406.
Hamers RJ, Demuth JE. ATOMIC-STRUCTURE AND BONDING OF SI(111)-(SQUARE-ROOT-3XSQUARE-ROOT-3)AL. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1988;6:512-516.
Gonzalez-Moreno R, Cook PL, Zegkinoglou I, Liu X, Johnson PS, Yang W, Ruther RE, Hamers RJ, Tena-Zaera R, Himpsel FJ, et al. Attachment of Protoporphyrin Dyes to Nanostructured ZnO Surfaces: Characterization by Near Edge X-ray Absorption Fine Structure Spectroscopy. Journal of Physical Chemistry C. 2011;115:18195-18201.
C
Lockett MR, Weibel SC, Phillips MF, Shortreed MR, Sun B, Corn RM, Hamers RJ, Cerrina F, Smith LM. Carbon-on-metal films for surface plasmon resonance detection of DNA arrays. Journal of the American Chemical Society. 2008;130:8611-+.
Koch RH, Hamers RJ. CHARACTERIZATION OF ELECTRON TRAPPING DEFECTS ON SILICON BY SCANNING TUNNELING MICROSCOPY. Surface Science. 1987;181:333-339.
Hamers RJ. CHARACTERIZATION OF LOCALIZED ATOMIC SURFACE-DEFECTS BY TUNNELING MICROSCOPY AND SPECTROSCOPY. Journal of Vacuum Science & Technology B. 1988;6:1462-1467.
Hamers RJ, Stavis C, Pokhrel A, Franking R, Ruther RE, Wang X, Cooperrider MC, Zheng H, Carlisle JA, Butler JE. Characterization of molecular and biomolecular layers on diamond thin films by infrared reflection-absorption spectroscopy. Diamond and Related Materials. 2011;20:733-742.
Cahill DG, Hamers RJ. CHARGE DYNAMICS AT THE SILICON(001) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY AND SURFACE PHOTOVOLTAGE. Scanning Microscopy. 1992;6:931-936.
Higgins SR, Hamers RJ. Chemical dissolution of the galena(001) surface observed using electrochemical scanning tunneling microscopy. Geochimica et Cosmochimica Acta. 1996;60:3067-3073.
McGuire MM, Jallad KN, Ben-Amotz D, Hamers RJ. Chemical mapping of elemental sulfur on pyrite and arsenopyrite surfaces using near-infrared Raman imaging microscopy. Applied Surface Science [Internet]. 2001;178:105-115. Available from: <Go to ISI>://000169475300013
Cai W, Lin Z, Strother T, Smith LM, Hamers RJ. Chemical modification and patterning of iodine-terminated silicon surfaces using visible light. Journal of Physical Chemistry BJournal of Physical Chemistry B. 2002;106:2656-2664.
Cai W, Lin Z, Strother T, Smith LM, Hamers RJ. Chemical Modification and Patterning of Iodine-Terminated Silicon Surfaces Using Visible Light. The Journal of Physical Chemistry B [Internet]. 2002;106:2656-2664. Available from: http://pubs.acs.org/doi/abs/10.1021/jp013523h
Shah S, Benson MC, Bishop LM, Huhn AM, Ruther RE, Yeager JC, Tan YZ, Louis KM, Hamers RJ. Chemically assembled heterojunctions of SnO2 nanorods with TiO2 nanoparticles via "click" chemistry. Journal of Materials Chemistry. 2012;22:11561-11567.
Cardiel AC, Benson MC, Bishop LM, Louis KM, Yeager JC, Tan Y, Hamers RJ. Chemically Directed Assembly of Photoactive Metal Oxide Nanoparticle Heterojunctions via the Copper-Catalyzed Azide-Alkyne Cycloaddition "Click" Reaction. ACS Nano. 2012;6:310-318.
Bronikowski MJ, Hamers RJ. The chemistry of gallium deposition on Si(001) from trimethylgallium: An atomically resolved STM study. Surface Science. 1996;348:311-324.
Li B, Shang L, Marcus MS, Clare TL, Perkins E, Hamers RJ. Chemoselective nanowire fuses: Chemically induced cleavage and electrical, detection of carbon nanofiber bridges. Small. 2008;4:795-801.
Frank ER, Hamers RJ. Chlorine-induced restructuring of Ag(111) films observed by scanning tunneling microscopy. Journal of Catalysis. 1997;172:406-413.
Bishop LM, Yeager JC, Chen X, Wheeler JN, Torelli MD, Benson MC, Burke SD, Pedersen JA, Hamers RJ. A Citric Acid-derived Ligand for Modular Functionalization of Metal Oxide Surfaces via "Click" Chemistry. Langmuir. 2012;28:1322-1329.
Wang YJ, Shan J, Hamers RJ. Combined scanning tunneling microscopy and infrared spectroscopy study of the interaction of diborane with Si(001). Journal of Vacuum Science & Technology B. 1996;14:1038-1042.
Hamers RJ, Houston PL, Merrill RP. COMPETITION BETWEEN DIRECT-INELASTIC AND TRAPPING DESORPTION CHANNELS IN THE SCATTERING OF NO (V=O,J) FROM IR(111). Journal of Chemical Physics. 1988;88:6548-6555.
Radadia AD, Stavis CJ, Carr R, Zeng H, King WP, Carlisle JA, Aksimentiev A, Hamers RJ, Bashir R. Control of Nanoscale Environment to Improve Stability of Immobilized Proteins on Diamond Surfaces. Advanced Functional Materials. 2011;21:1040-1050.
Hovis JS, Lee S, Liu HB, Hamers RJ. Controlled formation of organic layers on semiconductor surfaces. Journal of Vacuum Science & Technology B. 1997;15:1153-1158.

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