Variation of GaN valence bands with biaxial stress and quantification of residual stress

TitleVariation of GaN valence bands with biaxial stress and quantification of residual stress
Publication TypeJournal Article
Year of Publication1997
AuthorsEdwards, NV, Yoo, SD, Bremser, MD, Weeks, TW, Nam, OH, Davis, RF, Liu, H, Stall, RA, Horton, MN, Perkins, NR, Kuech, TF, Aspnes, DE
JournalApplied Physics Letters
Volume70
Pagination2001-2003
Date PublishedApr
DOI10.1063/1.119089