Unexpected bismuth concentration profiles in metal-organic vapor phase epitaxy-grown Ga(As1-xBix)/GaAs superlattices revealed by Z-contrast scanning transmission electron microscopy imaging

TitleUnexpected bismuth concentration profiles in metal-organic vapor phase epitaxy-grown Ga(As1-xBix)/GaAs superlattices revealed by Z-contrast scanning transmission electron microscopy imaging
Publication TypeJournal Article
Year of Publication2015
AuthorsWood, AW, Guan, Y, Forghani, K, Anand, A, Kuech, TF, Babcock, SE
JournalApl Materials
Volume3
Date PublishedMar
DOI10.1063/1.4915301