Spectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films

TitleSpectroscopic ellipsometry and low-temperature reflectance: complementary analysis of GaN thin films
Publication TypeJournal Article
Year of Publication1998
AuthorsEdwards, NV, Yoo, SD, Bremser, MD, Horton, MN, Perkins, NR, Weeks, TW, Liu, H, Stall, RA, Kuech, TF, Davis, RF, Aspnes, DE
JournalThin Solid Films
Volume313
Pagination187-192
Date PublishedFeb
DOI10.1016/s0040-6090(97)00815-8