Scanning Photoemission Microscopy on Maximum Reaches 0.1 Micron Resolution

TitleScanning Photoemission Microscopy on Maximum Reaches 0.1 Micron Resolution
Publication TypeJournal Article
Year of Publication1993
AuthorsCapasso, C, Ng, W, Raychaudhuri, AK, Liang, SH, Cole, RK, Guo, ZY, Wallace, J, Cerrina, F, Underwood, J, Perera, R, Kortright, J, Gilbert, PUPA, Margaritondo, G
JournalSurface Science
Volume287
Pagination1046-1050
Date PublishedMay
ISBN Number0039-6028
Accession NumberWOS:A1993LF07100099