Investigation of switching kinetics of interface traps in metal-oxide-semiconductor-field-effect-transistors with ultra-narrow channels

TitleInvestigation of switching kinetics of interface traps in metal-oxide-semiconductor-field-effect-transistors with ultra-narrow channels
Publication TypeJournal Article
Year of Publication2002
AuthorsShi, Y, Shen, B, Bu, HM, Yuan, XL, Gu, SL, Han, P, Zhang, R, Zheng, YD
JournalJapanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review PapersJapanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers
Volume41
Pagination2363-2366
Date PublishedApr
Accession Number553XW-0016