Extended-spectral-range Fourier transform infrared-attenuated total reflection spectroscopy on Si surfaces using a novel Si coated Ge attenuated total reflection prism

TitleExtended-spectral-range Fourier transform infrared-attenuated total reflection spectroscopy on Si surfaces using a novel Si coated Ge attenuated total reflection prism
Publication TypeJournal Article
Year of Publication1997
AuthorsRudkevich, E, Savage, DE, Cai, W, Bean, JC, Sullivan, JS, Nayak, S, Kuech, TF, McCaughan, L, Lagally, MG
JournalJournal of Vacuum Science & Technology a-Vacuum Surfaces and Films
Volume15
Pagination2153-2157
Date PublishedJul-Aug
DOI10.1116/1.580622