Electronic-Structure of Localized Si Dangling-Bond Defects by Tunneling Spectroscopy

TitleElectronic-Structure of Localized Si Dangling-Bond Defects by Tunneling Spectroscopy
Publication TypeJournal Article
Year of Publication1988
AuthorsHamers, RJ, Demuth, JE
JournalPhysical Review Letters
Volume60
Pagination2527-2530
Date PublishedJun
ISBN Number0031-9007
Accession NumberWOS:A1988N799600022