DETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY

TitleDETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY
Publication TypeJournal Article
Year of Publication1989
AuthorsHamers, RJ, Kohler, UK
JournalJournal of Vacuum Science & Technology a-Vacuum Surfaces and Films
Volume7
Pagination2854-2859
Date PublishedJul-Aug
ISBN Number0734-2101
Accession NumberWOS:A1989AG67700062