DETERMINATION OF EPITAXIAL ALXGA1-XAS COMPOSITION FROM X-RAY-DIFFRACTION MEASUREMENTS

TitleDETERMINATION OF EPITAXIAL ALXGA1-XAS COMPOSITION FROM X-RAY-DIFFRACTION MEASUREMENTS
Publication TypeJournal Article
Year of Publication1991
AuthorsGoorsky, MS, Kuech, TF, Tischler, MA, Potemski, RM
JournalApplied Physics Letters
Volume59
Pagination2269-2271
Date PublishedOct
ISBN Number0003-6951
DOI10.1063/1.106040