Characterization of Localized Atomic Surface-Defects by Tunneling Microscopy and Spectroscopy

TitleCharacterization of Localized Atomic Surface-Defects by Tunneling Microscopy and Spectroscopy
Publication TypeJournal Article
Year of Publication1988
AuthorsHamers, RJ
JournalJournal of Vacuum Science & Technology B
Volume6
Pagination1462-1467
Date PublishedJul-Aug
ISBN Number1071-1023
Accession NumberWOS:A1988P729100076