Characterization of Electron Trapping Defects on Silicon by Scanning Tunneling Microscopy

TitleCharacterization of Electron Trapping Defects on Silicon by Scanning Tunneling Microscopy
Publication TypeJournal Article
Year of Publication1987
AuthorsKoch, RH, Hamers, RJ
JournalSurface Science
Volume181
Pagination333-339
Date PublishedMar
ISBN Number0039-6028
Accession NumberWOS:A1987G720900039